- 2024
Hrdá, J., Moško, M., Píš, I., Vojteková, T., Pribusová Slušná, L., Hutár, P., Precner, M., Dobročka, E., Španková, M., Hulman, M., Chromik, Š., Šiffalovič, P., Bondino, F., and Sojková, M.: Investigating structural, optical, and electron-transport properties of lithium intercalated few-layer MoS2 films: Unraveling the influence of disorder, Applied Phys. Lett. 124 (2024) 123101. (CEMEA ITMS 313021 T081, APVV-19-0365, 21-0231, VEGA2/0068/21, 2/0140/22)
- 2023
Vojteková, T., Pribusová Slušná, L., Dobročka, E., Precner, M., Sojková, M., Hrdá, J., Gregor, M., and Hulman, M.: Fourier-transform infrared spectroscopy of MoTe2 thin films, Phys. Status Solidi B 260 (2023) 2300250.
Pribusová Slušná, L., Vegso, K., Dobročka, E., Vojteková, T., Nádaždy, P., Halahovets, Y., Sojková, M., Hrdá, J., Precner, M., Šiffalovič, P., Chen, Z., Huang, Y., Ražnjević, S., Zhang, Z., and Hulman, M.: Ordered growth of hexagonal and monoclinic phases of MoTe2 on a sapphire substrate, CrystEngComm 25 (2023) 5706-5713.
Sojková, M., Píš, I., Hrdá, J., Vojteková, T., Pribusová Slušná, L., Vegso, K., Šiffalovič, P., Nádaždy, P., Dobročka, E., Krbal, M., Fons, P.J., Munnik, F., Magnano, E., Hulman, M., and Bondino, F.: Lithium-induced reorientation of few-layer MoS2 films, Chem. Mater. 35 (2023) 6246-6257.
Kočí, M., Izsák, T., Vanko, G., Sojková, M., Hrdá, J., Szabó, O., Husák, M., Végsö, K., Varga, M., and Kromka, A.: Improved gas sensing capabilities of MoS2/diamond heterostructures at room temperature, ACS Applied Mater. Interfaces 15 (2023) 34206-34214.
Varga, M., Sojková, M., Hrdá, J., Hutár, P., Parza Saeb, S., Vanko, G., Pribusová-Slušná, L., Ondic, L., Fait, J., Kromka, A., and Hulman, M.: Technological challenges in the fabrication of MoS2/diamond heterostructures. In NANOCON 2022. Proc. 14th Inter. Conf. Nanomater. – Res. & Appl. Ostrava. Tanger Ltd. 2023, pp 21-27. ISBN: 978-80-88365-09-9.
Sojková, M., Hrdá, J., Vojteková, T., Pribusová Slušná, L., Végsö, K., Dobročka, E., Šiffalovič, P., and Hulman, M.: Novel approach in fabrication of few-layer transition metal dichalcogenide films. In Proc. 11th Inter. Conf. on Advances in Electron. Photon. Technol. – ADEPT. Eds. D. Jandura et al. Žilina: EDIS 2023. ISBN 978-80-554-1977-0. P. 32-35.
Hrdá, J., Moško, M., Vojteková, T., Pribusová Slušná, L., Precner, M., Hulman, M., Španková, M., Chromik, Š., and Sojková, M.: Electron transport in lithium-doped few-layer MoS2 films. In Proc. 11th Inter. Conf. on Advances in Electron. Photon. Technol. – ADEPT. Eds. D. Jandura et al. Žilina: EDIS 2023. ISBN 978-80-554-1977-0. P. 83-86.
- 2022
Vegso, K., Shaji, A., Sojková, M., Pribusová Slušná, L., Vojteková, T., Hrdá, J., Halahovets, Y., Hulman, M., Jergel, M., Majková, E., Wiesmann, J., and Šiffalovič, P.: A wide-angle X-ray scattering laboratory setup for tracking phase changes of thin films in a chemical vapor deposition chamber, Rev. Sci Instrum. 93 (2022) 113909.
Shaji, A., Vegso, K., Sojková, M., Hulman, M., Nádaždy, P., Halahovets, Y., Pribusová Slušná, L., Vojteková, T., Hrdá, J., Jergel, M., Majková, E., Wiesmann, J., and Šiffalovič, P.: Stepwise sulfurization of MoO3 to MoS2 thin films studied by real-time X-ray scattering, Applied Surface Sci 606 (2022) 154772.
Hrdá, J., Vojteková, T., Pribusová-Slušná, L., Dobročka, E., Hulman, M., Píš, I., and Sojková, M.: Influence of Li-doping on the structural properties of thin-layer MOS2 films. In Proc. 10th Inter. Conf. on Advances in Electron. Photon. Technol. – ADEPT. Eds. M. Feiler et al. Žilina: EDIS 2022. ISBN 978-80-554-1884-1. P. 85-88.
Varga, M., Sojková, M., Chromik, Š., Hrdá, J., Parza Saeb, S., Pribusová-Slušná, L., Remes, Z., Ondic, L., Fait, J., Kromka, A., and Hulman, M.: Transition metal dichalcogenides and diamond – new friends for promising heterostructures. In NANOCON 2022. Abstracts 14th Inter. Conf. Nanomater. – Res. & Appl. Ostrava, Tanger Ltd. 2022, p. 59. ISBN 978-80-88356-07-5.
- 2021
Hrdá, J., Tašková, V., Vojteková, T., Pribusová Slušná, L., Dobročka, E., Píš, I., Bondino, F., Hulman, M., and Sojková, M.: Tuning the charge carrier mobility in few-layer PtSe2 films by Se: Pt ratio, RSC Adv. 11 (2021) 27292.
Pribusová Slušná, L., Vojteková, T., Hrdá, J., Pálková, H., Šiffalovič, P., Sojková, M., Vegso, K., Hutár, P., Dobročka, E., Varga, M., and Hulman, M.: Optical characterisation of few-layer PtSe2 nanosheet films, ACS Omega 6 (2021) 35398-35403.
Sojková, M., Hrdá, J., Volkov, S., Vegso, K., Shaji, A., Vojteková, T., Pribusová Slušná, L., Gál, N., Dobročka, E., Šiffalovič, P., Roch, T., Gregor, M., and Hulman, M.: Growth of PtSe2 few-layer films on NbN superconducting substrate, Applied Phys. Lett. 119 (2021) 013101.
Shaji, A., Vegso, K., Sojková, M., Hulman, M., Nádaždy, P., Hutár, P., Pribusová Slušná, L., Hrdá, J., Bodik, M., Hodas, M., Bernstorff, S., Jergel, M., Majková, E., Schreiber, F., and Šiffalovič, P.: Orientation of few-layer MoS2 films: in-situ x-ray scattering study during sulfurization, J. Phys. Chem. C 125 (2021) 9461–9468.
Hrdá, J., Tašková, V., Vojteková, T., Pribusová Slušná, L., Dobročka, E., Píš, I.. Bondino, F., Hulman, M., and Sojková, M.: Selenium content influences the charge carrier mobility in few-layer PtSe2 films. In Proc. 9th Inter. Conf. on Advances in Electron. Photon. Technol. – ADEPT. Žilina: EDIS 2021. ISBN 978-80-554-1735-6. P. 103-106.
Sojková, M., Hrdá, J., Volkov, S., Végso, K., Shaji, A., Vojteková, T., Pribusová Slušná, L., Gál, N., Dobročka, E., Šiffalovič, P., Roch, T., Gregor, M., and Hulman, M.: PtSe2 few-layer films grown on NbN superconducting substrate. In Proc. 9th Inter. Conf. on Advances in Electron. Photon. Technol. – ADEPT. Žilina: EDIS 2021. ISBN 978-80-554-1735-6. P. 9-12.
Moravský, L., Michalczuk, B., Hrdá, J., Hamaguchi, S., and Matejčík, Š.: Monitoring of nonthermal plasma degradation of phthalates by ion mobility spectrometry, Plasma Process. Polymers 18 (2021) 2100032. (Not IEE SAS)
- 2020
Michalczuk, B., Moravský, L., Hrdá, J., and Matejčík, Š.: Atmospheric Pressure chemical ionisation study of selected volatile organic compounds (VOCs) by ion mobility spectrometry coupled with orthogonal acceleration time of flight mass spectrometry, Inter. J. Mass Spectrometry 449 (2020) 116275. (Not IEE SAS)