RNDr. Vladimír CAMBEL, DrSc.

  • 2024

Krylov, S., Kalmykova, T., Ščepka, T., and Cambel, V.: Magnetic nanostructures with defined magnetic states fabricated by focused ion beam, Results in Phys. 60 (2024) 107669.

  • 2023

Ščepka, T., Feilhauer, J., Tóbik, J., Krylov, S., Kalmykova, T., Cambel, V., and Mruczkiewicz, M.: Control of closure domain state circulation in coupled triangular permalloy elements using MFM tip, J. Applied Phys. 134 (2023) 213902.

Pribulová, Z., Marcin, M., Kačmarčík, J., Gabáni, S., Flachbart, K., Shitsevalova, N., Mori, T., Sluchanko, N., Anisimov, M., Cambel, V., Šoltýs, J., Marcenat, C., Klein, T., and and Samuely, P.: Defect-induced weak collective pinning in superconducting YB6 crystals, JPhys Mater. 6 (2023) 045002.

Vetrova, I., Feilhauer, J., Cambel, V., and Šoltýs, J.: MFM tip with a ferromagnetic disk-shaped apex for large domain scanning, IEEE Trans. on Nanotechnol. 22 (2023) 634-640.

Feilhauer, J., Tóbik, J., Šoltýs, J., and Cambel, V.: Numerical characterization of magnetic vortex probe imaging for magnetic force microscopy, IEEE Trans. Magnet. 59 (2023) 6500210.

  • 2022

Krylov, S., Vetrova, I., Feilhauer, J., Fedor, J. Dérer, J., Šoltýs, J., and Cambel, V.: Improved durable vortex core MFM tip, J. Magnet. Magn. Mater. 555 (2022) 169357.

Kalmykova, T., Krylov, S., and Cambel, V.: Ferromagnetic nanostructures for topological magnonics fabricated by focused ion beam technology. In IEEE 2nd Ukrainian Microwave Week – UkrMW 2022, virtual. IEEE 2022, pp. 88-91. ISBN 979-8-3503-3152-3.

  • 2021

Zelent, M., Vetrova, Iu.V., Li, X., Zhou, Y., Šoltýs, J., Gubanov, V.A., Sadovnikov, A.V., Ščepka, T., Dérer, J., Stoklas, R., Cambel, V., and Mruczkiewicz, M.: Skyrmion formation in nanodisks using magnetic force microscopy tip, Nanomater. 11 (2021) 2627.

Vetrova, Iu.V., Zelent, M., Šoltýs, J., Gubanov, V.A., Sadovnikov, A.V., Ščepka, T., Dérer, J., Stoklas, R., Cambel, V., and Mruczkiewicz, M.: Investigation of self-nucleated skyrmion states in the ferromagnetic/nonmagnetic multilayer dot, Applied Phys. Lett. 118 (2021) 212409.

Marcin, M., Pribulová, Z., Kačmarčík, J., Medvecká, Z., Klein, T., Verchenko, V.Yu., Cambel, V., Šoltýs, J., and Samuely, P.: One or two gaps in Mo8Ga41 superconductor? Local Hall-probe magnetometry study, Supercond. Sci Technol. 34 (2021) 035017.

  • 2020

Marcin, M., Pribulová, Z., Kačmarčík, J., Verchenko, V.Yu., Shevelkov, A.V., Cambel, V., Šoltýs, J., and Samuely, P.: Local magnetometry of superconducting Mo8Ga41 and Mo7VGa41: vortex pinning study, Acta Phys. Polonica A 137 (2020) 794-796.

Šoltýs, J., Feilhauer, J., Vetrova, J., Tóbik, J., Bublikov, K., Ščepka, T., Fedor, J., Dérer, J., and Cambel, V.: Magnetic-field imaging using vortex-core MFM tip, Applied Phys. Lett. 116 (2020) 242406.

  • 2018

Neilinger, P., Ščepka, T., Mruczkiewicz, M., Dérer, J., Manca, D., Dobročka, E., Samardak, A.S., Grajcar, M., and Cambel, V.: Ferromagnetic resonance study of sputtered Pt/Co/Pt multilayers, Applied Surface Sci 461 (2018) 202-205.

Šoltýs, J., Precner, M., Fedor, J., and Cambel, V.: Tailored SPM probes for dual-tip force microscopy. In: NANOCON 2017. Brno: Tanger Ltd., 2018, p. 759-764. ISBN 978-8-0872-9481-9.

  • 2017

Neilinger (Sečianska), K., Šoltýs, J., Mruczkiewicz, M., Dérer, J., Cambel, V., : Dual-cantilever magnetometer for study of magnetic interactions between patterned permalloy microstructures. J. Magnetism Magnetic Mater. 444 (2017) 354-360.

Tóbik, J., Martoňák, R., Cambel, V., : Free-energy landscapes in magnetic systems from metadynamics. Phys. Rev. B 96 (2017) 140413(R).

Pribulová, Z., Medvecká, Z., Kačmarčík, J., Komanický, V., Klein, T., Rodière, P., Levy-Bertrand, F., Michon, B., Marcenat, C., Barančeková Husaníková, P., Cambel, V., Šoltýs, J., Karapetrov, G., Borisenko, S., Evtushinsky, D., Berger, H., Samuely, P., : Magnetic and thermodynamic properties of CuxTiSe2 single crystals. Phys. Rev. B 95 (2017) 174512.

Neilinger (Sečianska), K., Šoltýs, J., Cambel, V., : Study of magnetic micro-ellipses by cantilever sensor. Acta Phys. Polonica A 131 (2017) 833-836.

  • 2016

Neilinger (Sečianska), K., Šoltýs, J., Truchly, M., Dérer, J., Cambel, V., : Fabrication of double cantilever sensor for study of magnetic microstructures. In: Proc. 22th Inter. Conf. on Applied Phys. of Cond. Matter (APCOM 2016). Eds. J. Vajda and I. Jamnický. Bratislava: FEI STU 2016. ISBN 978-80-227-4572-7. P. 61-64.

Medvecká, Z., Klein, T., Cambel, V., Šoltýs, J., Karapetrov, G., Levy-Bertrand, F., Michon, B., Marcenat, C., Pribulová, Z., Samuely, P., : Observation of a transverse Meissner effect in CuxTiSe2 single crystals. Phys. Rev. B 93 (2016) 100501(R).

Kačmarčík, J., Pribulová, Z., Samuely, T., Szabó, P., Cambel, V., Šoltýs, J., Herrera, E., Suderow, H., Correa-Orellana, A., Prabhakaran, D., Samuely, P., : Single-gap superconductivity in ẞ-Bi2Pd. Phys. Rev. B 93 (2016) 144502.

  • 2015

Tóbik, J., Cambel, V., Karapetrov, G., : Asymmetry in time evolution of magnetization in magnetic nanostructures. Sci Reports 5 (2015) 12301.

Neilinger (Sečianska), K., Šoltýs, J., Tóbik, J., Dérer, J., Cambel, V., : Cantilever sensor for study of magnetic microstructures In: Proc. 21th Inter. Conf. on Applied Phys. of Cond. Matter (APCOM 2015). Eds. J. Vajda and I. Jamnický. Bratislava: FEI STU 2015. ISBN 978-80-227-4373-0. P. 189-193.

Precner, M., Fedor, J., Šoltýs, J., Cambel, V., : Dual-tip magnetic force microscopy with suppressed influence on magnetically soft samples. Nanotechnol. 26 (2015) 055304.

Ščepka, T., Polakovič, T., Šoltýs, J., Tóbik, J., Kulich, M., Kúdela, R., Dérer, J., Cambel, V., : Individual vortex nucleation/annihilation in ferromagnetic nanodots with broken symmetry observed by micro/Hall magnetometry. AIP Adv. 5 (2015) 117205.

  • 2014

Precner, M., Fedor, J., Tóbik, J., Šoltýs, J., Cambel, V., : High resolution tips for switching magnetization MFM. Acta Phys. Polonica A 126 (2014) 386-387.

Pribulová, Z., Medvecká, Z., Kačmarčík, J., Komanický, V., Klein, T., Barančeková Husaníková, P., Cambel, V., Šoltýs, J., Karapetrov, G., Samuely, P., : Local magnetometry of Cu0,064TiSe2. Acta Phys. Polonica A 126 (2014) 370-371.

Barančeková Husaníková, P., Cambel, V., Fedor, J., Šoltýs, J., Karapetrov, G., : Magnetization studies of Cu0.058TiSe2 near a quantum critical point. Acta Phys. Polonica A 126 (2014) 336-337.

Ščepka, T., Šoltýs, J., Precner, M., Fedor, J., Tóbik, J., Gregušová, D., Gucmann, F., Kúdela, R., Cambel, V., : Vortex dynamics in ferromagnetic nanoelements observed by micro-hall probes. Acta Phys. Polonica A 126 (2014) 390-391.

  • 2013

Cambel, V., Precner, M., Fedor, J., Šoltýs, J., Tóbik, J., Ščepka, T., Karapetrov, G., : High resolution switching magnetization magnetic force microscopy. Applied Phys. Lett. 102 (2013) 062405.

Šoltýs, J., Gaži, Š., Fedor, J., Tóbik, J., Precner, M., Cambel, V., : Magnetic nanostructures for non-volatile memories. Microelectr. Engn. 110 (2013) 474-478.

Barančeková Husaníková, P., Fedor, J., Dérer, J., Šoltýs, J., Cambel, V., Iavarone, M., May, S., Karapetrov, G., : Magnetization properties and vortex phase diagram of CuxTiSe2 single crystals. Phys. Rev. B 88 (2013) 174501.

Cambel, V., Tóbik, J., Šoltýs, J., Fedor, J., Precner, M., Gaži, Š., Karapetrov, G., : The influence of shape anisotropy on vortex nucleation in Pacman-like nanomagnets,. J. Magnetism Magnetic Mater. 336 (2013) 29-36.

Samuely, T., Szabó, P., Pribulová, Z., Sung, N., Cho, B., Klein, T., Cambel, V., Rodrigo, J., Samuely, P., :Type II superconductivity in SrPd2Ge2. Supercond. Sci Technol. 26 (2013) 015010.

  • 2012

Ščepka, T., Gregušová, D., Gaži, Š., Haščík, Š., Fedor, J., Šoltýs, J., Kúdela, R., Cambel, V., : Detection elements for on-cantilever laboratory. In: ASDAM 2012. Eds. Š. Haščík, J. Osvald. Piscataway: IEEE 2012. ISBN 978-1-4673-1195-3. P. 91-94.

Tóbik, J., Cambel, V., Karapetrov, G., : Dynamics of vortex nucleation in nanomagnets with broken symmetry. Phys. Rev. B 86 (2012) 134433.

Cambel, V., Karapetrov, G., : Micromagnetic simulations of pac-man-like nanomagnets for memory applications. J. Nanosci Nanotechnol. 12 (2012) 7422-7425.

Precner, M., Gregušová, D., Šoltýs, J., Fedor, J., Gucmann, F., Tóbik, J., Kúdela, R., Cambel, V., : Nucleation and annihilation of magnetic vortices in Pacman-like nanodots observed by micro-Hall probes. In: ASDAM 2012. Eds. Š. Haščík, J. Osvald. Piscataway: IEEE 2012. ISBN 978-1-4673-1195-3. P. 87-90.

  • 2011

Cambel, V., Karapetrov, G., : Control of vortex chirality and polarity in magnetic nanodots with broken rotational symmetry. Phys. Rev. B 84 (2011) 014424.

Karapetrov, G., Belkin, A., Iavarone, M., Yefremenko, V., Pearson, J., Divan, R., Cambel, V., Novosad, V., :Dimensionality crossover in vortex dynamics of magnetically coupled F-S-F hybrids. Supercond. Sci Technol. 24 (2011) 024012.

Šoltýs, J., Kúdela, R., Kučera, M., Eliáš, P., Novák, J., Cambel, V., Vávra, I., Kostič, I., : Characterization of an AlGaAs/GaAs quantum well prepared on objects of pyramidal shape. J. Crystal Growth 316 (2011) 67-70.

Cambel, V., Šoltýs, J., : Skenovacie mikroskpie. In: Kryofyzika a nanoelektronika. Košice: ÚEF SAV, 2011. ISBN 978-80-968060-9-6. S. 269-305.

Barančeková Husaníková, P., Kačmarčík, J., Cambel, V., Karapetrov, G., : Superconducting and normal state parameters of single crystal Cu0.10TiSe2. Solid State Comm. 151 (2011) 227-228.

Cambel, V., Gregušová, D., Eliáš, P., Fedor, J., Kostič, I., Maňka, J., Ballo, P., : Switching magnetization magnetic force microscopy – an alternative to conventional lift-mode MFM, J. Electr. Engn. 62 (2011) 37-43.

  • 2010

Martaus, J., Cambel, V., Gregušová, D., Kúdela, R., Fedor, J., : 50-nm local anodic oxidation technology of semiconductor heterostructures. J. Nanosci Nanotechnol. 10 (2010) 4448-4453.

Gregušová, D., Kúdela, R., Eliáš, P., Šoltýs, J., Kostič, I., Cambel, V., : GaAs/AlAs/InGaP heterostructure: a versatile material basis for cantilever designs. J. Micromech. Microeng. 20 (2010) 097001.

Cambel, V., Eliáš, P., Gregušová, D., Martaus, J., Fedor, J., Karapetrov, G., Novosad, V., : Magnetic elements for switching magnetization magnetic force microscopy tips. J. Magnetism Magn. Mater. 322 (2010) 2715-2721.

Cambel, V., Eliáš, P., Gregušová, D., Fedor, J., Martaus, J., Karapetrov, G., Novosad, V., Kostič, I., : Novel magnetic tips developed for the switching magnetization magnetic force microscopy. J. Nanosci Nanotechnol. 10 (2010) 4477-4481.

  • 2009

Gregušová, D., Martaus, J., Fedor, J., Kúdela, R., Kostič, I., Cambel, V., : On-tip sub-micrometer Hall probes for magnetic microscopy prepared by AFM lithography. Ultramicroscopy 109 (2009) 1080-1084.

Kováč, P., Hušek, I., Melišek, T., Fedor, J., Cambel, V., Morawski, A., Kario, A., : Properties of hot pressed MgB2/Ti tapes. Physica C 469 (2009) 713-716.

  • 2008

Cambel, V., Martaus, J., Šoltýs, J., Kúdela, R., Gregušová, D., : Local anodic oxidation by AFM tip developed for novel semiconductor nanodevices. Ultramicroscopy 108 (2008) 1021-1024.

Martaus, J., Gregušová, D., Cambel, V., Kúdela, R., Šoltýs, J., : New approach to local anodic oxidation of semiconductor heterostructures. Ultramicroscopy 108 (2008) 1086-1089.

Cambel, V., Šoltýs, J., : Skenovacia sondová mikroskpia vo výskume povrchov materiálov. In: Rozprávanie o materiáloch. Bratislava: ÚMMS SAV, 2008. ISBN 978-80-970027-6-3. S. 81-92.

Martaus, J., Cambel, V., Gregušová, D., Kúdela, R., : Sub-micron Hall probes prepared by tip-induced local anodic oxidation. In: ASDAM 2008. Eds. Š. Haščík and J.Osvald. Piscataway: IEEE 2008. ISBN: 978-1-4244-2325-5. P. 195-198.

  • 2007

Cambel, V., Martaus, J., Šoltýs, J., Kúdela, R., Gregušová, D., : AFM nanooxidation process – technology perspective for mesoscopic structures. Surface Sci. 601 (2007) 2717-2723.
Martaus, J., Gregušová, D., Cambel, V., Kúdela, R., Šoltýs, J., : AFM tip induced local anodic oxidation of InGaP/AlGaAs/GaAs heterostructures. In: EW-MOVPE XII: extended abstracts. Bratislava: IEE SAS, 2007. P. 299-302.

Bartolome, E., Pavau, A., Guitierrez, J., Granados, X., Pomar, A., Puig, T., Obradors, X., Cambel, V., Šoltýs, J., Gregušová, D., Chen, D., Sanchez, A., : Artificial magnetic granularity effects on patterned epitaxial YBa2Cu3O7-x thin films. Phys. Rev. B 76 (2007) 094508.

Bartolome, E., Navau, C., Sanchez, A., Chen, D., Puig, T., Obradors, X., Cambel, V., : Imaging current percolation and ac losses in artificially granular YBCO thin films. IEEE Trans. Applied Supercond. 17 (2007) 3223-3226.

Cambel, V., Karapetrov, G., Novosad, V., Bartolome, E., Gregušová, D., Fedor, J., Kúdela, R., Šoltýs, J., :Novel Hall sensors developed for magnetic field imaging systems. J. Magnetism Magn. Mater. 316 (2007) 232-235.

Kúdela, R., Martaus, J., Cambel, V., Kučera, M., Dobročka, E., : Novel MOVPE grown 2DEG structures for local anodic oxidation. In: EW-MOVPE XII: extended abstracts. Bratislava: IEE SAS, 2007. P. 49-52.

Šoltýs, J., Cambel, V., Kúdela, R., Eliáš, P., : Study into the shape of oxide lines formed by LAO – influence an oxidized material. Surface Sci 601 (2007) 2876-2880.

Šoltýs, J., Gregušová, D., Kúdela, R., Kostič, I., Cambel, V., : Study of epitaxially overgrown pyramids developed for active tips in scanning force microscopy. In: EW-MOVPE XII: extended abstracts. Bratislava: IEE SAS, 2007. P. 297-298.

Cambel, V., Šoltýs, J., : The influence of sample conductivity on local anodic oxidation by the tip of atomic force microscope. J. Applied Phys. 102 (2007) 074315. (APVV 51-045705).

  • 2006

Martaus, J., Cambel, V., Kúdela, R., Gregušová, D., Šoltýs, J., : 2D electron transport through potential barrier prepared by LAO on shallow GaAs/AlxGa1-xAs/InGaP heterostructures. In: ASDAM 2006. Eds. J. Breza et al. Piscataway: IEEE 2006. ISBN: 1-4244-0396-0. P. 253-256.

Šoltýs, J., Gregušová, D., Kúdela, R., Šatka, A., Kostič, I., Cambel, V., : Formation of sharp-apex pyramids for active tips used in scanning probe microscopy. In: ASDAM 2006. Eds. J. Breza. et al. Piscataway: IEEE 2006. ISBN: 1-4244-0396-0. P. 105-108.

Cambel, V., Fedor, J., Gregušová, D., Kúdela, R., : Hallovská magnetometria, Čs. čas. pro fyziku 56 (2006) 152-157.

Cambel, V., Šoltýs, J., Martaus, J., Moško, M., : IV characteristics in structures prepared by tip induced oxidation J. de Physique IV 132 (2006) 171-175.

Belkin, A., Fedor, J., Pankowski, P., Iavarone, M., Novosad, V., Karapetrov, G., Cambel, V., Gregušová, D., Kúdela, R., : Switching of magnetic domains in Permalloy microstructures using two-dimensional electron gas. Applied Physics Lett. 89 (2006) 182513.

Gregušová, D., Eliáš, P., Öszi, Z., Kúdela, R., Šoltýs, J., Fedor, J., Cambel, V., Kostič, I., : Technology and properties of a vector hall sensor. Microelectronics J. 37 (2006) 1543-1546.

  • 2005

Bartolome, E., Granados, X., Cambel, V., Fedor, J., Kováč, P., Hušek, I., : Critical current density analysis of ex situ MgB2 wire by in-field and temperature Hall probe imaging. Supercond. Sci Technol. 18 (2005) 1135-1140.

Cambel, V., Fedor, J., Gregušová, D., Kováč, P., Hušek, I., : Large-scale high-resolution scanning Hall probe microscope used for MgB2 filament characterization. Supercond. Sci Technol. 18 (2005) 417-421.

  • 2004

Cambel, V., Gregušová, D., Fedor, J., Kúdela, R., Bending, S., : Scanning vector Hall probe microscopy. J. Magnetism Magnetic Mater. 272-276 (2004) 2141-2143.

Cambel, V., Šoltýs, J., Moško, M., Kúdela, R., : Two-dimensional electron transport through a barrier prepared by tip-induced oxidation. Superlatt. Microstruct. 36 (2004) 359-367.

  • 2003

Gregušová, D., Cambel, V., Fedor, J., Kúdela, R., Šoltýs, J., Lalinský, T., Kostič, I., Bending, S., : Fabrication of a vector Hall sensor for magnetic microscopy. Applied Phys. Lett. 82 (2003) 3704-3706.

Cambel, V., Gregušová, D., Kúdela, R., : Formation of GaAs three-dimensional objects using AlAs “facet-forming” sacrificial layer and H3PO4, H2O2, H2O based solution. J. Applied Phys. 94 (2003) 4643-4648.

Gregušová, D., Cambel, V., Kúdela, R., Šoltýs, J., Kostič, I., Attolini, G., Pelosi, C., : Investigation of the GaAs-pyramids overgrowth using MOCVD. J. Crystal Growth 248 (2003) 417-420.

Fröhlich, K., Cambel, V., Machajdík, D., Baumann, P., Lindner, J., Schumacher, M., Jurgensen, H., : Low-temperature growth of RuO2 films for conductive electrode applications. Materials Sci in Semicond. Processing 5 (2003) 173-177.

Kúdela, R., Štrichovanec, P., Gregušová, D., Cambel, V., Šoltýs, J., Hasenöhrl, S., Novák, J., Kostič, I., Attolini, G., Pelosi, C., : MOVPE growth of AlGaAs/GaAs and InGaP/GaAs structures on patterned GaAs substrates. In: EW MOVPE X. Univ. Lecce 2003. P. 219.

Machajdík, D., Kobzev, A., Fröhlich, K., Cambel, V., : RBS and ERD study of epitaxial RuO2 films deposited on different single crystal substrates. Vacuum 70 (2003) 313-317.

Fedor, J., Cambel, V., Gregušová, D., Hanzelka, P., Dérer, J., Volko, J., : Scanning vector Hall probe microscope. Rev. Sci Instruments 74 (2003) 5105-5110.

Šoltýs, J., Cambel, V., Fedor, J., : Study of tip-induced Ti-film oxidation in atomic force microscopy contact and non-contact mode Acta Physica Polonica A 103 (2003) 553-558.

  • 2002

Fröhlich, K., Machajdík, D., Cambel, V., Kostič, I., Pignard, S., : Epitaxial growth of low-resistivity RuO2 films on View the MathML source-oriented Al2O3 substrate. J. Crystal Growth 235 (2002) 377-383.

Kicin, S., Cambel, V., Kuliffayová, M., Gregušová, D., Kováčová, E., Novák, J., Kostič, I., Förster, A., :Fabrication of GaAs symmetric pyramidal mesas prepared by wet-chemical etching using AlAs interlayer. J. Applied Physics 91 (2002) 878-880.

Eliáš, P., Hasenöhrl, S., Fedor, J., Cambel, V., : Hall bar device processing on patterned substrates using optical lithography. Sensors Actuators A 101 (2002) 150-155.

Cambel, V., Eliáš, P., Gregušová, D., Hasenöhrl, S., Kúdela, R., Fedor, J., : Mikroskopická magnetometria. In: 12. Konf. slov. fyzikov. Eds. M.Reiffers, L.Just. Košice: Slov. fyzik. spol. 2002. P. 68.

Kúdela, R., Kučera, M., Gregušová, D., Cambel, V., Novák, J., : MOVPE growth of 1220 nm (InGa)(AsP) LED structures. In: ASDAM ’02. Ed. J.Breza and D.Donoval. Piscataway: IEEE 2002. ISBN: 0-7803-7276-X. P. 183.

Baumann, P., Doppelt, P., Fröhlich, K., Gueroudji, L., Cambel, V., Machajdík, D., Schumacher, M., Lindner, J., Schienle, F., Burgess, D., Strauch, G., Jurgensen, H., Guillon, H., Jimenez, C., : Platinum, ruthenium and ruthenium dioxide electrodes deposited by metal organic chemical vapor deposition for oxide applications Integrated Ferroelectrics 44 (2002) 135.

Cambel, V., Kicin, S., Kuliffayová, M., Kováčová, E., Novák, J., Kostič, I., Förster, A., : Preparation of patterned GaAs structures for MEMS and MOEMS. Materials Sci Engn. C 19 (2002) 161-165.

  • 2001

Pripko, M., Halabica, A., Fröhlich, K., Plecenik, A., Cambel, V., Chromik, Š., Machajdík, D., : Growth and characterization of LaMnO3/SrTiO3, Bi-layer J. de Physique 11 (2001) Pr11-127-131.

Fröhlich, K., Machajdík, D., Cambel, V., Fedor, J., Pisch, A., Lindner, J., : Growth of Ru and Ru2 films by metal-organic chemical vapour deposition J. de Physique 11 (2001) Pr3-325-332.

Eliáš, P., Cambel, V., Hasenöhrl, S., Kostič, I., : MOCVD growth of InP and InGaAs on InP non-planar substrates patterned with {1 1 0} quasi facets. J. Crystal Growth 233 (2001) 141-149.

Fröhlich, K., Machajdík, D., Cambel, V., Lupták, R., Pignard, S., Weiss, F., Baumann, P., Lindner, J., : Substrate dependent growth of highly conductive RuO2 films J. de Physique 11 (2001) Pr11-77-81.

  • 2000

Cambel, V., Karapetrov, G., Eliáš, P., Hasenöhrl, S., Kwok, W., Krause, J., Maňka, J., : Approaching the pT range with a 2DEG InGaAs/InP Hall sensor at 77 K. Microelectr. Engn. 51-52 (2000) 333-342.

Kromka, A., Dúbravcová, V., Cambel, V., : Atomic force microscopy investigation of diamond thin film. In: APCOM 2000. Liptovský Mikuláš: Military Academy 2000. P. 25-28.

Karapetrov, G., Cambel, V., Kwok, W., Crabtree, G., Zheng, H., Veal, B., : Contactless characterization of melt-textured superconducting junctions using micro-Hall sensor arrays. Physica B 284-288 (2000) 2065-2066.

Eliáš, P., Hasenöhrl, S., Cambel, V., Kostič, I., : Crystallographic dependence of OMVPE InGaAs/InP lateral growth on patterned (100) InP substrates prepared by wet etching. Thin Solid Films 380 (2000) 105-107.

Kováč, P., Cambel, V., Kopera, Ľ., Melišek, T., Pitel, J., Bukva, P., : Quality measurement of Bi(2223)/Ag tapes by Hall probe array IoP Conf. Ser. No. 167 (2000) 531-534.

  • 1999

Karapetrov, G., Cambel, V., Kwok, W., Nikolova, R., Crabtree, G., Zheng, H., Veal, B., : Contactless characterization of melt-textured superconducting junctions using micro-Hall sensor arrays J. Applied Phys. 86 (1999) 6282-6286.

Novák, J., Hasenöhrl, S., Cambel, V., Kučera, M., Wehmann, H., Wuellner, D., : Electrical and morphological properties of InGaP Mater. Sci Engn. B 66 (1999) 102-105.

Kováč, P., Cambel, V., Bukva, P., : Measuring the homogeneity of Bi(2223)/Ag tapes by four probe method and Hall probe array Supercond. Sci Technol. 12 (1999) 465-471.

Eliáš, P., Cambel, V., Hasenöhrl, S., Hudek, P., Novák, J., : SEM and AFM characterisation of high MESA patterned InP subtrated prepared by wet etching Mater. Sci Engn. B 66 (1999) 15-20.

  • 1998

Cambel, V., Kúdela, R., Gregušová, D., Hasenöhrl, S., Eliáš, P., Novák, J., : Characterization of 2DEG Hall probes in high magnetic field at 4,2K. In: ASDAM 98. Ed. J.Breza. Piscataway: IEEE 1998. P. 31.

Cambel, V., Gregušová, D., Eliáš, P., Hasenöhrl, S., Olejníková, B., Novák, J., Schaepers, T., Neurohr, K., Fox, A., : Characterization of InGaAs/InP microscopic Hall probe arrays with 2DEG active layer Mater. Sci Engn. B 51 (1998) 188.

Cambel, V., Olejníková, B., Eliáš, P., Kúdela, R., Novák, J., Kučera, M., : Microscopic 2DEG linear Hall probe arrays Superlattice Microstruct. 24 (1998) 181.

Morvic, M., Betko, J., Hasenöhrl, S., Gregušová, D., Cambel, V., Eliáš, P., Novák, J., : On quantum Hall resistance and Shubnikov de Haas effect measurements on InP/InGaAs structures. In: HEAD 97. Eds. P.Kordoš and J.Novák. Dordrecht: Kluwer Acad. Pub 1998. P. 285.

Eliáš, P., Gregušová, D., Cambel, V., Hasenöhrl, S., Kúdela, R., Hudek, P., Novák, J., : Preparation of microscopic Hall probes and arrays. In: HEAD ’97. Eds. P.Kordoš and J. Novák. NATO ASI Series 4/45. Dordrecht: Kluwer Acad. Publ. 1998. P. 273.

Cambel, V., Eliáš, P., Kúdela, R., Novák, J., Olejníková, B., Mozolová, Ž., Majoros, M., Kvitkovič, J., Hudek, P., : Preparation, characterization and application of microscopic Hall probe arrays Solid State Electron. 42 (1998) 247.

Novák, J., Hasenöhrl, S., Cambel, V., Kúdela, R., Kučera, M., : Resistivity anisotropy in ordered InGaP grown at 640C. In: ASDAM 98. Ed. J.Breza. Piscataway: IEEE 1998. P. 23.

Ďurica, M., Cambel, V., Gregušová, D., Eliáš, P., Hasenöhrl, S., Kúdela, R., : Testing superconducting tapes by a 2DEG Hall probe array. In: HEAD ’97. Eds. P.Kordoš and J. Novák. NATO ASI Series 4/45. Dordrecht: Kluwer Acad. Publ. 1998. P. 277.

  • 1997

Kováč, P., Cambel, V., Gregušová, D., Eliáš, P., Hušek, I., Kúdela, R., Hasenöhrl, S., Ďurica, M., : Testing of homogenity of Bi(2223)/Ag tapes by Hall probe array IoP Conf. Series No. 158 (1997) 1311.

  • 1996

Cambel, V., Eliáš, P., Kúdela, R., Ďurica, M., Novák, J., : Microscopic linear Hall probe arrays Electron. Lett. 32 (1996) 1236.

Cambel, V., Eliáš, P., Kúdela, R., Olejníková, B., Novák, J., Ďurica, M., Majoros, M., Kvitkovič, J., Mozolová, Ž., Hudek, P., : Preparation, characterization and application of microscopic linear hall probe arrays. In: ASDAM 96. Ed. T.Lalinský et. al. Bratislava: 1996. P. 153.

  • 1995

Moško, M., Mošková, A., Cambel, V., : Carrier-carrier scattering in photoexcited intrinsic GaAs quantum wells and its effect on femtosecond plasma thermalization Phys. Rev. B 51 (1995) 16860.

Moško, M., Cambel, V., : Thermalization of one-dimensional electron gas by many-body Coulomb scattering: molecular dynamics model for quantum wires Acta Physica Polonica 87 (1995) 157.

  • 1994

Cambel, V., Moško, M., : Carrier-carrier scattering in photoexcited quantum wells: Inadequacy of two-particle model at low densities Semicond. Sci Technol. 9 (1994) 474.

Moško, M., Cambel, V., : Thermalization of one-dimensional electron gas by many-body Coulomb scattering: molecular dynamics model for quantum wires Phys. Rev. B 50 (1994) 8864.

  • 1993

Cambel, V., Moško, M., : The influence of ionized impurities on electron-electron drag between parallel two-dimensional gases: Monte Monte Carlo simulation with molecular dynamics Semicond. Sci Technol. 8 (1993) 364.

  • 1992

Moško, M., Cambel, V., Mošková, A., : Electron-electron drag between parallel two-dimensional gases Phys. Rev. B 46 (1992) 5012.

  • 1991

Cambel, V., Sudek, J., Kovalenko, A., Datskov, V., Voevodin, M., : Simple cooled CCD camera for beam diagnostics Rev. Sci Instrum. 62 (1991) 2723.

Cambel, V., Voevodin, M., Datskov, V., Kovalenko, A., Sajfulin, S., : Sistemy dlja issledovanija prostranstvennych charakteristik pučkov na osnove priborov s zariadovoj svjazju. Dubna: JINR 1991, P9-91-301.

  • 1989

Malacký, L., Kuzmík, J., Cambel, V., : Optical properties of metal GaInAs contacts for Schottky photodiodes Phys. Status Solidi A 115 (1989) K121.

  • 1988

Cambel, V., : Analýza spektrálnej citlivosti plošných obrazových snímačov CCD, Slaboproudý obzor 49 (1988) 331.

Cambel, V., Malacký, L., : Riadkový snímač CCD ako detektor polohy, Sdělovací technika (1988) 5.

Morvic, M., Malacký, L., Cambel, V., Novák, J., Kordoš, P., : Základné vlastnosti polohovocitlivých fotodetektorov, Slaboproudý obzor 49 (1988) 312.

Malacký, L., Morvic, M., Cambel, V., Novák, J., : Základné vlastnosti dvojsúradnicových polohovocitlivých fotodetektorov. In: Fotonika ’88. Bratislava: ČSVTS pri ČSMU 1988. S. 86.

  • 1987

Cambel, V., : Analýza niektorých vlastností nábojovo viazaných štruktúr. Kand. diz. práca. Bratislava: UK KFPL 1987.

Malacký, L., Cambel, V., : Externý interfejs pre PMD 85. In: Ročenka amatérskeho rádia. Praha: Naše vojsko 1987. S. 48.

Slavka, R., Cambel, V., : Jednorozmerný model štruktúry CCD s ponoreným kanálom, Elektrotechn. časopis 38 (1987) 241.

Morvic, M., Malacký, L., Cambel, V., Novák, J., Kordoš, P., : Niektoré parametre polohovocitlivých detektorov. In: Senzory a senzorové systémy. Ed. J.Felix. Košice: Dom ČSVTS 1987. S.111.

Cambel, V., Malacký, L., : Relatívne spektrálne charakteristiky riadkových a plošných snímačov CCD, Elektrotechn. časopis 38 (1987) 561.