RNDr. Dušan KORYTÁR, CSc.

  • 2024

Asimakopoulou, M., Bellucci, V., Birnsteinova, S., Yao, Z., Zhang, Y., Petrov, I., Deiter, C., Mazzolari, A., Romagnoni, M., Korytar, D., Zaprazny, Z., Kuglerova, Z.,  Juha, L., Lukić, B., Rack, A., Samoylova, L., Garcia-Moreno, F., Hall, S.A., Neu, T.,  Liang, X., Vagovic, P., and Villanueva-Perez, P.: Development towards high-resolution kHz-speed rotation-free volumetric imaging, Optics Express 32 (2024)  4413-4426.

Bellucci, V., Birnsteinova, S., Sato, T., Letrun, R., Koliyadu, J.C.P., Kim, C., Giovanetti, G., Deiter, C., Samoylova, L., Petrov, I., Morillo, L.L., Graceffa, R., Adriano, L., Huelsen, H., Kollmann, H., Calliste, T.N.T., Korytar, D., Zápražný, Z., Mazzolari, A., Romagnoni, M., Asimakopoulou, E.M., Yao, Z., Zhang, Y., Ulicny, J., Meents, A., Chapman, H.N., Bean, R., Mancuso, A., Villanueva-Perez, P., and Vagovic, P.: Development of crystal optics for X-ray multi-projection imaging for synchrotron and XFEL sources, J. Synchrotron Radiation 31 (2024) 1534-1550. (Not IEE SAS)

  • 2021

Zápražný, Z., Zaťko, B., Korytár, D., Gál,, Jergel, M., Halahovets, Y., and Ferrari, C.: Testing of thickness homogeneity of Si crystal membranes using GaAs Timepix detector,  J. Instrument. 16 (2021) P06015.

Nádaždy, P., Hagara, J., Mikulík, P., Zápražný, Z., Korytár, D., Majková, E., Jergel, M., and Šiffalovič, P.: A high-throughput assembly of beam-shaping channel-cut monochromators for laboratory high-resolution X-ray diffraction and small-angle X-ray scattering experiments, J. Applied Crystall. 54 (2021) 730-738.

  • 2020

Zaťko, B., Šagátová, A., Zápražný, Z., Boháček, P., Sekáčová, M., Kováčová, E., Žemlička, J., Jakůbek, J., Korytár, D., Gál, N., and Nečas, V.: Study of the contrast resolution of Timepix detector with a semi-insulating GaAs sensor, J. Instrument. 15 (2020) C04004.

Ferrari, C., Beretta, S., Rotunno, E., Korytár, D., and Zápražný, Z.: Compressive strain formation in surface-damaged crystals, J. Applied Crystall. 53 (2020) 629-634.

  • 2019

Zápražný, Z., Korytár, D., Jergel, M., Halahovets, Y., Maťko, I., Šiffalovič, P., Kečkéš, J., Mikulík, P., Majková, E., and Thi, T.N.T.: Study of surface quality and subsurface damage of germanium optics produced by single point diamond nanomachining, Proc. SPIE 11032 (2019) 11032E.

Nádaždy, P., Hagara, J., Jergel, M., Majková, E., Mikulík, P., Zápražný, Z., Korytár, D., and Šiffalovič, P.: Exploiting the potential of beam-compressing channel-cut monochromators for laboratory high-resolution small-angle X-ray scattering experiments, J. Applied Crystall. 52 (2019) 498-506.

Zápražný, Z., Korytár, D., Jergel, M., Halahovets, Y., Kotlár, M., Maťko, I., Hagara, J., Šiffalovič, P., Keckes, J., and Majková, E.: Characterization of the chips generated by the nanomachining of germanium for X-ray crystal optics, Inter. J. Adv. Manufactur. Technol. 102 (2019) 2757-2767.

  • 2018

Zaťko, B., Hrubčín, L., Šagátová, A., Osvald, J., Boháček, P., Zápražný, Z., Sedlačková, K., Sekáčová, M., Dubecký, F., Skuratov, V.A., Korytár, D., and Nečas, V.: Schottky barrier detectors based on high quality 4H-SIC semiconductor: electrical and detection properties, Applied Surface Sci 461 (2018) 276-280.

Jergel, M., Halahovets, Yu., Maťko, I., Korytár, D., Zápražný, Z., Hagara, J., Nádaždy, P.,  Šiffalovič, P., Kečkéš, J., and Majková, E.: Finishing of Ge nanomachined surfaces for X-ray crystal optics, Inter. J. Advanced Manufact. Technol. 96 (2018) 3603–3617. (APVV 14-0745, VEGA 2/0092/18, ASFEU 26220220170, XTOPICS)

Zaťko, B., Zápražný, Z., Jakůbek, J., Šagátová, A., Boháček, P., Sekáčová, M., Korytár, D., Nečas, V., Žemlička, J., Mora, Y., and Pichotka, M.: Imaging performance of Timepix detector based on semi-insulating GaAs, J. Instrument. 13 (2018) C01034.

Korytár, D., Zápražný, Z., Ferrari, C., Frigeri, C., Jergel, M., Maťko, I., and Kečkeš, M.: Cross-sectional TEM study of subsurface damage in SPDT machining of germanium optics, Applied Optics 57 (2018) 1940-1943.

Zápražný, Z., Korytár, D., Jergel, M., Halahovets, Yu., Ferrari, C., Frigeri, C., Dobročka, E., Keckes, J., and Hagara, J.:  Towards x-ray crystal channel-cut monochromators prepared by nano-machining technique, Mater. Struct. 25 (2018) 75-78.(ASFEU 26220220170, APVV 14-0745, VEGA 2/0092/18, XOPTICS)

Zápražný, Z., Korytár, D., Jergel, M., Halahovets, Y., Kotlár, M., Maťko, I., Hagara, J., Šiffalovič, P., Keckes, J., and Majková, E.: Study of chips originating from nanomachining of monocrystalline germanium for X ray optics. In: 10th Inter. Conf. Solid State Surfaces Interfaces Conf. – SSSI 2018. Extended Abstract Book. Eds. R. Brunner et al. Bratislava: Comenius Univ., 2018, pp. 85-86. ISBN 978-80-223-4606-1.

Jergel, M., Halahovets, Y., Maťko, I., Šiffalovič, P., Majková, E., Korytár, D., and Zápražný, Z.: Surface finishing of X-ray crystals optics after nanomachining. In: 10th Inter. Conf. Solid State Surfaces Interfaces Conf. – SSSI 2018. Extended Abstract Book. Eds. R. Brunner et al. Bratislava: Comenius Univ., 2018, pp. 30-33. ISBN 978-80-223-4606-1.

Korytár, D., Zápražný, Z., Jergel, M., Ferrari, C., Halahovets, Y., and Dobrovodský, J.: Surface quality, subsurface damage and mechanisms of material removal in nanomachining of brittle materials. In: 10th Inter. Conf. Solid State Surfaces Interfaces Conf. – SSSI 2018. Extended Abstract Book. Eds. R. Brunner et al. Bratislava: Comenius Univ., 2018, pp. 43-46. ISBN 978-80-223-4606-1.

  • 2017

Zápražný, Z., Korytár, D., Halahovets, Yu., Jergel, M., Ferrari, C., Hagara, J., and Dobročka, E.:  Diffraction surfaces in x-ray crystal monochromators prepared by nano-machining technique, Mater. Struct. 24 (2017) 25-26.

  • 2016

Mikula, P., Vrána, M., Šaroun, J., Woo, W., Em, V., Čapek, J., Korytár, D., : Comparison of double crystal (+n,-m) and (+n,+m) settings containing a fully asymmetric diffraction geometry of a bent perfect crystal with the output beam expansion,. J. Phys.: Conf. Ser. 746 (2016) 012029. (Not IEE SAS).

Šiffalovič, P., Végsö, K., Hodas, M., Jergel, M., Halahovets, Y., Pelletta, M., Korytár, D., Zápražný, Z., Majková, E., : In situ x-ray reciprocal space mapping for characterization of nanomaterials In: X-ray and neutron techniques for nanomaterials characterization. Ed. C. S.S.R. Kumar. Berlin, Springer 2016. ISBN 978-3-662-48604-7. P. 507-544.

Drga, J., Korytár, D., Zápražný, Z., Jergel, M., Halahovets, Y., : Influence of tool rake angle used for nanomachining of germanium In: Transfer 2016 – 17th Inter. Sci Conf. Trenčín: TU A. Dubčeka, 2016. ISBN 978-80-8075-756-4.

Zápražný, Z., Korytár, D., Jergel, M., Šiffalovič, P., Halahovets, Y., Keckes, J., Maťko, I., Ferrari, C., Vagovič, P., Mikloška, M., : Nano-machining for advanced x-ray crystal optics. AIP Conf. Proc. 1764 (2016) 020005.

Hrivňak, S., Uličný, J., Mikeš, L., Cecilia, A., Hamann, E., Baumbach, T., Švéda, L., Zápražný, Z., Korytár, D., Gimenez, E., Wagner, U., Rau, C., Greven, H., Vagovič, P., : Single-distance phase retrieval algorithm for Bragg Magnifier microscope. Optics Express 24 (2016) 27753-27762.

Végsö, K., Jergel, M., Šiffalovič, P., Majková, E., Korytár, D., Zápražný, Z., Mikulík, P., Vagovič, P., :Towards high-flux X-ray beam compressing channel-cut monochromators. J. Applied Crystall. 49 (2016) 1885-1892.

  • 2015

Zápražný, Z., Korytár, D., Jergel, M., Šiffalovič, P., Dobročka, E., Vagovič, P., Ferrari, C., Mikulík, P., Demydenko, M., Mikloška, M., : Calculations and surface quality measurements of high-asymmetry angle x-ray crystal monochromators for advanced x-ray imaging and metrological applications. Optical Engn. 54 (2015) 035101.

Mikula, P., Vrána, M., Korytár, D., : Edge refraction contrast imaging on a coventional neutron diffractometer employing dispersive double-crystal monochromator. Phys. Procedia 69 (2015) 320-326.

Vagovič, P., Korytár, D., Cecilia, A., Hamann, E., Baumbach, T., Pelliccia, D., : Laboratory-based multi-modal X-ray microscopy and micro-CT with Bragg magnifiers,. Optics Express 23 (2015) 18391-18400.

Zápražný, Z., Korytár, D., Jergel, M., Šiffalovič, P., Halahovets, Y., Mikloška, M., : Nano-machining for x-ray crystal optics In: Proc. ADEPT. 3st Inter. Conf. on Advan. in Electronic and Photonic Technol. Eds. D. Pudis et al. Žilina: Univ. Žilina 2015. ISBN 978-80-554-1033-3. P. 243-246.

Korytár, D., Halahovets, Y., Jergel, M., Zápražný, Z., : Nanomachining of hard X-ray crystal optics,. DGaO Proc. 2015.

Hodas, M., Šiffalovič, P., Pelletta, M., Halahovets, Y., Jergel, M., Majková, E., Korytár, D., Zápražný, Z., Vagovič, P., : Passivation of ge crystals by B4C thin layer deposition In: Proc. 21th Inter. Conf. on Applied Phys. of Cond. Matter (APCOM 2015). Eds. J. Vajda and I. Jamnický. Bratislava: FEI STU 2015. ISBN 978-80-227-4373-0. P. 180-183.

  • 2014

Wachulak, P., Wegrzynski, L., Zápražný, Z., Bartnik, A., Fok, T., Jarocki, R., Kostecki, J., Szczurek, M.,Korytár, D., Fiedorowicz, H., : Extreme ultraviolet tomography of multi-jet gas puff target for high-order harmonic generation. Applied Phys. B 117 (2014) 253-263.

Wachulak, P., Wegrzynski, L., Zápražný, Z., Bartnik, A., Fok, T., Jarocki, R., Kostecki, J., Szczurek, M.,Korytár, D., Fiedorowicz, H., : Extreme ultraviolet tomography using a compact laser–plasma source for 3D reconstruction of low density objects. Optics Lett. 39 (2014) 532-535.

Mikula, P., Vrána, M., Seong, B., Woo, W., Em, V., Korytár, D., : Neutron diffraction studies of a high resolution double crystal (+n,-m) setting containing Si(220) abd Si(311) bent perfect crystals in symmetric and fully asymmetric diffraction geometry, respectively. J. Phys.: Conf. Series 528 (2014) 012004. (Not IEE SAS).

Zápražný, Z., Korytár, D., Šiffalovič, P., Jergel, M., Demydenko, M., Mikulík, P., Dobročka, E., Ferrari, C., Vagovič, P., Mikloška, M., : Simulations and surface quality testing of high asymetry angle x-ray crystal monochromators for advanced x-ray imaging applications. Proc. SPIE 9207 (2014) 92070Y.

Vagovič, P., Švéda, L., Cecilia, A., Hammann, E., Pelliccia, D., Gimenez, E., Korytár, D., Pavlov, K., Zápražný, Z., Zuber, M., Koenig, T., Olbinado, M., Yashiro, W., Momose, A., Fiederle, M., Baumbach, T., : X-ray Bragg magnifier microscope as a linear shift invariant imaging system: image formation and phase retrieval,. Optics Express 22 (2014) 21508-21520.

Zápražný, Z., Korytár, D., Šiffalovič, P., Jergel, M., : X-ray crystal optics for analyser based imaging. In: Proc. 20th Inter. Conf. on Applied Phys. of Cond. Matter (APCOM 2014). Eds. J. Vajda and I. Jamnický. Bratislava: FEI STU 2014. P. 198-201.

  • 2013

Ferrari, C., Buffagni, E., Bonnini, E., Korytár, D., : Curved focusing crystals for hard x-ray astronomy Crystall. Reports 58 (2013) 1058-1062.

Jergel, M., Šiffalovič, P., Végsö, K., Majková, E., Korytár, D., Zápražný, Z., Perlich, J., Ziberi, B., Cornejo, M., Vagovič, P., : Extreme x-ray beam compression for a high-resolution table-top grazing-incidence small-angle x-ray scattering setup. J. Applied Crystall. 46 (2013) 1544-1550.

Ferrari, C., Buffagni, E., Bonnini, E., Korytár, D., : High diffraction efficiency in crystal curved by surface damage. J. Applied Crystall. 46 (2013) 1576-1581.

Vagovič, P., Korytár, D., Cecilia, A., Hamann, E., Švéda, L., Pelliccia, D., Härtwig, J., Zápražný, Z., Oberta, P., Dolbnya, I., Shawney, K., Fleschig, U., Fiederle, M., Baumbach, T., : High-resolution high-efficiency X-ray imaging system based on the in-line Bragg magnifier and the Medipix detector. J. Synchrotron Radiation 20 (2013) 153-159.

Korytár, D., Vagovič, P., Végsö, K., Šiffalovič, P., Dobročka, E., Jark, W., Áč, V., Zápražný, Z., Ferrari, C., Cecilia, A., Hamann, E., Mikulík, P., Baumbach, T., Fiederle, M., Jergel, M., : Potential use of V-channel Ge(220) monochromators in X-ray metrology and imaging. J. Applied Crystall. 46 (2013) 945-952.

Korytár, D., Vagovič, P., Ferrari, C., Šiffalovič, P., Jergel, M., Dobročka, E., Zápražný, Z., Áč, V., Mikulík, P., : Process-induced inhomogeneities in higher asymmetry angle x-ray monochromators. Proc. SPIE 8848 (2013) 8848-28.

Zápražný, Z., Korytár, D., Mikulík, P., Áč, V., : Processing of projections containing phase contrast in laboratory micro-computerized tomography imaging. J. Applied Crystall. 46 (2013) 933-938.

Korytár, D., Vagovič, P., Ferrari, C., Šiffalovič, P., : X-ray crystal optics based on Germanium single crystals In: Germanium: Characteristics, Sources and Applications. Ed. E.E. Feuerstein. New York: Nova Sci Publ. 2013. ISBN 978-1-62948-181-4. P. 105-140.

  • 2012

Zápražný, Z., Korytár, D., Áč, V., Konopka, P., Bielecki, J., : Phase contrast imaging of lightweight objects using microfocus X-ray source and high resolution CCD camera. J. Instrum. 7 (2012) C03005.

  • 2011

Zápražný, Z., Korytár, D., Áč, V., Konopka, P., Bielecki, J., : Computerized tomography using high resolution X-ray imaging system with a microfocus source. In: APCOM 2011. Eds. D. Pudiš et al. Žilina: FEE TU, 2011. ISBN: 978-80-554-0386-1. P. 208-211.

Vagovič, P., Korytár, D., Mikulík, P., Cecilia, A., Ferrari, C., Yang, Y., Hänschke, D., Hamann, E., Pelliccia, D., Lafford, T., Fiederle, M., Baumbach, T., : In-line Bragg magnifier based on V-shaped germanium crystals. J. Synchrotron Radiation 18 (2011) 753-760.

Áč, V., Kasala, J., Korytár, D., Zápražný, Z., Konopka, P., : Practical experiences with X-ray micro tomography of aluminium alloys. In: APCOM 2011. Eds. D. Pudiš et al. Žilina: FEE TU, 2011. ISBN: 978-80-554-0386-1. P. 204-207.

Ferrari, C., Germini, F., Korytár, D., Mikulík, P., Peverini, L., : X-ray diffracted intensity for double-reflection channel-cut Ge monochromators at extremely asymmetric diffraction conditions. J. Applied Crystall. 44 (2011) 353-358.

  • 2010

Korytár, D., Ferrari, C., Mikulík, P., Vagovič, P., Dobročka, E., Áč, V., Konopka, P., Erko, A., Abrosimov, N., Zápražný, Z., : 1D X‐ray Beam Compressing Monochromators. AIP Conf. Proc. 1221 (2010) 59-62.

Zápražný, Z., Korytár, D., Dubecký, F., Áč, V., Stachura, Z., Lekki, J., Bielecki, J., Mudroň, J., : Experience with imaging by using of microfocus x-ray source, J. Electrical Engn. 61 (2010) 287-290.

Zápražný, Z., Korytár, D., Dubecký, F., Áč, V., Lekki, J., Stachura, Z., Bielecki, J., Mudroň, J., : First experience with imaging using microfocus x-ray source. In: APCOM 2010. Eds. J. Vajda and M. Weis. Bratislava: FEI STU, 2010. ISBN: 978-80-227-3307-6. P. 240-243.

Korytár, D., Ferrari, C., Mikulík, P., Vagovič, P., Dobročka, E., Áč, V., Konopka, P., Erko, A., Abrosimov, N., : Linearly graded GeSi beam-expanding/compressing X-ray monochromator J. Applied Crystall. 43 (2010) 176-178.

Áč, V., Korytár, D., Zápražný, Z., Dobročka, E., : Thermally tuned x-ray V-shaped monochromator – simulations and experimental results. In: APCOM 2010. Eds. J. Vajda and M. Weis. Bratislava: FEI STU, 2010. ISBN: 978-80-227-3307-6. P. 93-96.

  • 2008

Korytár, D., Ferrari, C., Mikulík, P., Germini, F., Vagovič, P., Baumbach, T., : High resolution 1D and 2D crystal optics based on asymmetric diffractors. In: Modern Developments in X-Ray and Neutron Optics. Eds. A.Erko et al. Berlin: Springer 2008. ISBN: 978-3-540-74560-0. P. 501-512.

Áč, V., Perichta, P., Korytár, D., Mikulík, P., : Thermal effects under synchrotron radiation power absorption. In: Modern Developments in X-Ray and Neutron Optics. Eds. A.Erko et al. Berlin: Springer 2008. ISBN: 978-3-540-74560-0. P. 513-524.

  • 2007

Áč, V., Korytár, D., : Analysis of SR thermal load studied by FEA,. Physica Status Solidi (a) 204 (2007) 2804-2828.

Vagovič, P., Korytár, D., Mikulík, P., Ferrari, C., : On the design of a monolithic 4-bounce high resolution X-ray monochromator. Nuclear Instr. Methods in Phys. Res. B 265 (2007) 599-604.

Dubecký, F., Ferrari, C., Korytár, D., Gombia, E., Nečas, V., : Performance of semi-insulating GaAs-based radiation detectors: Role of key physical parameters of base mnaterials. Nuclear Instr. and Methods in Phys. Res. A 576 (2007) 27-31. (VEGA 2/7170/27).

  • 2006

Schäfers, F., Mertin, M., Gorgoi, M., Dudzik, D., Korytár, D., : High resolution crystal optics schemes for HIKE-PES tested at the 7T wiggler MAGS beamline. In: BESSY – Annual Report 2006. Ed. K.Godehusen. Berlin: BESSY 2007. P. 446-448.

Vagovič, P., Korytár, D., Mikulík, P., Ferrari, C., : X-ray optics for HRXRD measurements and X-ray imaging, Bull. Polish Synchrotron Radiation Soc. 5 (2006) 92.

  • 2005

Ferrari, C., Pernot, P., Mikulík, P., Helfen, L., Verdi, N., Baumbach, T., Lübbert, D., Korytár, D., :Distribution and Burgers vectors of dislocations in semiconductor wafers investigated by rocking-curve imaging. J. Applied Crystallography 38 (2005) 91-96.

Korytár, D., Baumbach, T., Ferrari, C., Helfen, L., Verdi, N., Mikulík, P., Kubena, A., Vagovič, P., : Monolithic two-dimensional beam compressor for hard x-ray beams. J. Phys. D: Appl. Phys. 38 (2005) A208-A212.

  • 2003

Ferrari, C., Verdi, N., Lübbert, D., Korytár, D., Mikulík, P., Baumbach, T., Helfen, L., Pernot, P., : Determination of lattice plane curvature and dislocation Burgers vector density in crystals by rocking curve imaging technique Proc. SPIE 5195 (2003) 84-93.

Mikulík, P., Baumbach, T., Korytár, D., Lübbert, D., Perrot, P., : Micrometer-resolved determination of 3D lattice misorientation for the semiconductor wafers inspection by synchrotron radiation area diffractometry, J. Phys. D 36 (2003) A74-A78. (Not IEE SAS).

Korytár, D., Mikulík, P., Ferrari, C., Hrdý, J., Baumbach, T., Freund, A., Kubena, A., : Two-dimensional x-ray magnification based on a monolithic beam conditioner. J. Phys. D 36 (2003) A65-A68.

  • 2002

Mikulík, P., Baumbach, T., Korytár, D., Pernot, P., Lübbert, D., Helfen, L., Landesberger, C., : Advanced X-ray diffraction imaging techniques for semiconductor wafer characterisation. Materials Structure 9 (2002) 87-88. (Not IEE SAS).

Baumbach, T., Mikulík, P., Korytár, D., Pernot, P., Lübbert, D., Herms, M., Helfen, L., Landesberger, C., : Advanced x-ray imaging for semiconductor wafer characterization. In: SIMC-XII. Piscataway: IEEE 2002. P. 153-158.

Boháček, P., Korytár, D., Ferrari, C., Dubecký, F., Surma, B., Zaťko, B., Šmatko, V., Huran, J., Fornari, R., Sekáčová, M., Strzelecka, S., : Correlation of crystal defects and galvanomagnetic parameters of semi-insulating InP with performance of radiation detectors fabricated from characterised materials. Materials Sci Engn. B 91-92 (2002) 516-520.

  • 2001

Ferrari, C., Korytár, D., : A monolithic monochromator–collimator for high-resolution X-ray diffraction. J. Applied Crystallography 34 (2001) 608-612.

Korytár, D., Hrdý, J., Artemiev, N., Ferrari, C., Freund, A., : Sagittal X-ray beam deviation at asymmetric inclined diffractors. J. Synchrotron Radiation 8 (2001) 1136-1139.

Korytár, D., Boháček, P., Ferrari, C., : X-ray flat diffractor optics II. Czechoslovak J. Phys. 51 (2001) 35-47.

Korytár, D., Ferrari, C., : X-ray topography in the study of semiconductors. Acta Physica Slovaca 51 (2001) 9-15.

  • 2000

Zaťko, B., Dubecký, F., Darmo, J., Euthymiou, P., Nečas, V., Krempasky, M., Sekáčová, M., Korytár, D., Csabay, O., Harmatha, L., Pelfer, P., : Electrical and detection performance of radiation detector based on bulk semi-insulating InP: Role of detector volume. In: ASDAM 2000. Eds. J.Osvald et al. Piscataway: IEEE 2000. ISBN 0-7803-5939-9. P. 429-432.

Korytár, D., Ferrari, C., Surma, B., Strzelecka, S., Dubecký, F., Huran, J., Fornari, R., Pekárek, L., Procházková, O., Šmatko, V., Hruban, A., : On physical parameters and crystal defects of bulk semi-insulating InP for radiation detector fabrication. In: SIMC-XI. Eds. C.Jagadish and N.J. Welham. Piscataway: IEEE 2000. P. 183-186.

Korytár, D., Boháček, P., Ferrari, C., : X-ray flat diffractor optics I. Czechoslovak J. Phys. 50 (2000) 841-849.

  • 1999

Korytár, D., Ferrari, C., Strzelecka, S., Šatka, A., Darmo, J., Dubecký, F., Hruba, L., : Study of crystal defects in radiation detectors grade semi-insulating GaAs. In: SIMC-X. Eds.: Z.Liliental-Weber and C.Miner. Piscataway: IEEE 1999. P. 331-334.

  • 1998

Korytár, D., Ferrari, C., Bochníček, Z., : X-ray multiple-beam analysis in high-resolution diffractometry of III-V heterostructures J. Applied Crystall. 31 (1998) 570.

  • 1997

Korytár, D., Boháček, P., Bešše, I., Francesco, L., Mikula, M., : Monolithic devices for high-resolution X-ray diffractometry and topography Il Nuovo Cimento D 19 (1997) 481.

Ferrari, C., Korytár, D., Kumar, J., : Study of residual strains in wafer crystal by means of lattice tilt mapping Il Nuovo Cimento D 19 (1997) 165.

  • 1996

Boháček, P., Krempasky, M., Korytár, D., Sekáčová, M., Senderák, R., : Mapping of the recidual voltage of Hall devices fabriced by P+Si coinplantation on GaAs wafers Physica Status Solidi A 155 (1996) 381.

Korytár, D., Bešše, I., Boháček, P., : Two-beam dynamical approach to multiple successive diffractors in x-ray crystal optics Czechoslovak J. Phys. 46 (1996) 1011-1026.

Korytár, D., Francesio, L., Kúdela, R., : X-ray diffraction study of MOCVD grown InGaP. In: HEAD 95. Eds. J.Novák et el. NATO ASI Series 3, High Technol. 11. Dordrecht: Kluwer Acad. Publ. 1996. P. 209.

  • 1995

Attolini, G., Bocchi, C., Franzosi, P., Korytár, D., Pelosi, C., : X-ray diffraction study of the lattice strain relaxation in MO VPE GaAs/Ge heterostructures J. Phys. D 28 (1995) A129.

  • 1993

Korytár, D., Hrivnák, M., : Experimental and computer similated mahyoh images of semiconductor wafers, Japan. J. Applied Phys. 32 (1993) 693.

Priecel, I., Ďuríček, L., Daniška, V., Korytár, D., : Improvement of implanted layer properties of semi-insulating GaAs by ingot annealing, J. Crystal Growth 126 (1993) 103.

Korytár, D., : Point-like and extended defects in Si and GaAs, J. Crystal Growth 126 (1993) 30.

  • 1992

Korytár, D., Daniška, V., Priecel, I., Babinský, M., : Large-area X-ray and CL study of GaAs wafers from various suppliers, J. Crystal Growth 121 (1992) 440.

  • 1990

Korytár, D., : Basic equations for multiple successive diffraction and angle distortion minimization in X-ray magnifiers, Czechoslov. J. Phys. B 40 (1990) 495.

  • 1989

Korytár, D., Kavický, P., Hulman, M., Weissensteiner, A., Tuchscher, M., : Defects in MOS technologies, Mater. Sci Forum 34-41 (1989) 1445.

Korytár, D., Holý, V., : Difrakce rtg záření na krystalických látkách-základy dynamické teorie. In: Čs. krystalografické názvosloví II. Ostrava: 1989. S. 10-20.

Korytár, D., : Three-dimensional multiple X-ray diffraction. In: X-Ray and Neutron Structure Analysis in Materials Sci. Ed. J. Hašek. New York: Plenum Press 1989. ISBN 978-1-4612-8072-9. P. 379-381.

Korytár, D., : X-ray diffraction study of AIIIBV materials, Crystal Propert. Preparation 19-20 (1989) 103.

  • 1986

Korytár, D., : Prvá medzinárodná škola o getráciách a defektovom inžinierstve GADEST ’85, Elektrotechn. čas. 37 (1986) 447.

Kotrč, J., Korytár, D., : Vplyv intrinčickej getrácie na niektoré vlastnosti riadkového snímača CCD, Elektrotechn. čas. 37 (1986) 655.

  • 1985

Korytár, D., Weissensteiner, A., Bunčiak, M., Ožvold, M., : Príčiny vzniku povrchových oxidačných vrstevných chýb v technológii CMOS, Elektrotechn. čas. 36 (1985) 632.

Šuranová, V., Daniška, V., Korytár, D., : Vplyv povrchových oxidačných vrstevných chýb v technológii CMOS na generačný čas života minoritných nosičov urzený z C-V kriviek, Elektrotechn. čas. 36 (1985) 616.

  • 1984

Korytár, D., : Lateral lattice parameter variation measurement by means of a double crystal X-ray method with oscillating slit, Czechosl. J. Phys. B 34 (1984) 1277.

  • 1978

Korytár, D., Mrafko, P., : Short-range order parameter for liquid He, Ne, and Ar, Acta Phys. Slovaca 28 (1978) 158.

Korytár, D., Mrafko, P.: Similarity and short-range order parameters for liquids and amorphous solids, Acta Phys. Slovaca 28 (1978) 108.