- 2025
Chidambaram, R.J., Rosová, A., Dobročka, E., Hušeková, K., Ťapajna, M., and Gucmann, F.: Structural characterization of twinning in β-Ga₂O₃ filament inclusions on Ga₂O₃ thin films epitaxially grown on sapphire substrates by MOCVD. In: Proc. ELITECH’25. Bratislava, Spektrum STU 2025. ISBN 978-80-227-5492-7.