1. Garcia, H.: Microelectron. Engn. 216 (2019) 111083.
Fröhlich, K., Kundrata, I., Blaho, M., Precner, M., Ťapajna, M., Klimo, M., Šuch, O., and Škvarek, O.: Hafnium oxide and tantalum oxide based resistive switching structures for realization of minimum and maximum functions, J. Applied Phys. 124 (2018) 152109.1. Aguirre, F.L.: IEEE Access 8 (2020) 202174.
Kukli, K., Kemeli, M., Vehkamäki, M., Heikkilä, M., Mizohata, K., Kalam, K., Ritala, M., Leskelä, M., Kundrata, I., and Fröhlich, K.: Atomic layer deposition and properties of mixed Ta2O5 ZrO2 films, AIP Adv. 7 (2017) 025001.1. Lehninger, D.: Applied Phys. Lett. 110 (2017) 262903. 2. Jiang, H.: ACS Applied Mater. Interf. 9 (2017) 16296. 3. Alkhayatt, A.H.O.: Optik 159 (2018) 305. 4. Jiang, S.: AIP Adv. 8 (2018) 085109. 5. Li, J.: Nanoscale Res. Lett. 14 (2019) 75. 6. Mackus, A.J.M.: Chem. Mater. 31 (2019) 1142. 7. Qin, G.: RSC Adv. 9 (2019) 35289. 8. Baek, G.: Microelectron. Engn. 215 (2019) 110987. 9. Anderson, E.C.: ACS Applied Electron. Mater. 1 (2019) 692. 10. Bhanu, J.U.: Mater. Sci Semicond. Process. 119 (2020) 105171. 11. Vitale, S.A.: ACS Applied Mater. Interfac. 12 (2020) 43250.