- FEI Quanta 3D 200i – dual-beam scanning electron microscope (SEM) and focused ion beam (FIB)
- OXFORD Omniprobe AutoProbe 200 – micromanipulator
- AMETEK EDAX – elemental analysis or chemical characterization
- FEI Gas Injection System 20089-Q – platina deposition
- Scanning the surface with focused electrons or ion beam
- Sample preparation for SEM, TEM, EDS (cross-section analysis)
- Micro-machining – modification of the AFM tips, drilling patterns to modify the samples
- Deposit platinum to make a contacts
- Chemical analysis, which includes spectrum collection and qualitative and quantitative elemental mapping

FEI Quanta 3D 200i dual-beam scanning electron microscope (SEM) and focused ion beam (FIB) with micromanipulator, EDAX analysis and gas injection system