Bruker D8 DISCOVER
The laboratory is working within the Consortium for multidisciplinary research of materials MULTIDISC founded by several institutes of SAS. It is equipped with a highly flexible diffractometer enabling to perform of various types of X-ray diffraction analysis and reflectivity measurements of thin films with thicknesses ranging from micrometers down to a few nanometers.
Equipment:
Diffractometer Bruker D8 DISCOVER equipped with
- Rotating Cu anode operating at 12 kW (max. 18 kW)
- Goebel mirror providing parallel beam with a divergence of ~0.03°
- Central Eulerian cradle, motorized sample stage with X, Y, Z shifts
- 4-bounce Bartels monochromator with two Ge 022 channel-cuts and 3-bounce Ge 022 analyzer crystal
- Knife edge collimator for reflectivity measurement
Application:
- Standard θ/2θ and Grazing incidence X-ray diffraction
- Texture and stress analysis
- High resolution X-ray diffraction and reciprocal space mapping
- Quantitative phase analysis, determination of crystallite size and strain
- X-ray reflectivity and diffuse scattering
Contact: doc. RNDr. E. Dobročka, CSc., Tel.: +421-2-5479 2507
Access: Individual access
Price: 20 €/hour for SAS employees (running costs)
Diffractometer Bruker D8 DISCOVER
PANalytical X’Pert3 MRD
The laboratory provides various types of high resolution X-ray diffraction analysis and reflectivity measurements of surfaces or thin films with thicknesses ranging from micrometers down to a few nanometers. Additionally, the laboratory allows modern phase contrast X-ray imaging techniques (2D, 3D). For detection of X-ray radiation, either indirect scintillation X-ray CCD based camera or single photon counting X-ray medipix type camera with Si or GaAs chips are used.
Equipment:
- PANalytical high resolution X-ray diffractometer with Cu anode
- High resolution X-ray imaging system for investigation of modern 2D and 3D imaging methods
- Manipulator for X-ray optics containing two high resolution hexapods
- X-ray detector based on medipix (timepix) readout chip using Si or GaAs X-ray sensor (pxs=55 µm)
- High resolution X-ray scintillation CCD camera (pxs=6.4 µm)
Application:
- High resolution X-ray diffraction and reciprocal space mapping
- X-ray reflectivity and diffuse scattering, texture analysis, and stress analysis
- Quantitative determination of phase crystallite size, strain, composition, and layer thickness
- Phase-contrast radiography or tomography of lightweight biological samples (>3 µm)
- Testing of modern single photon counting X-ray detectors within advanced X-ray imaging techniques
Contact: Ing. Zdenko Zápražný, PhD., Tel.: +421 259 222 480
Access: guided access, online booking OR
Price: 0 Eur/hour for SAS employees SAS
