Publikácie

2013

Kováč, P., Hušek, I., Kopera, Ľ., Melišek, T., Rosová, A., Dobročka, E., : Properties of in situ made MgB2 in Nb or Ti sheath, Supercond. Sci Technol. 26 (2013) 025007.

2012

Šouc, J., Gömöry, F., and Vojenčiak, M.: Coated conductor arrangement for reduced AC losses in a resistive-type superconducting fault current limiter, Supercond. Sci Technol. 25 (2012) 014005.

Tóbik, J., Cambel, V., and Karapetrov, G.: Dynamics of vortex nucleation in nanomagnets with broken symmetry, Phys. Rev. B 86 (2012) 134433.

Viljamaa, J., Kario, A., Dobročka, E., Reissner, M., Kulich, M., Kováč, P., and Haessler, W.: Effect of heat treatment temperature on superconducting performance of B4C added MgB2/Nb conductors, Physica C 473 (2012) 34-40.

Huran, J., Valovič, A., Kučera, M., Kleinová, A., Kováčová, E., Boháček, P., and Sekáčová, M.: Hydrogenated amorphous silicon carbon nitride films prepared by PECVD technology: properties, J. Electr. Engn. 65 (2012) 333-335.

Štrbik, V. and Chromik, Š.: Characterization of electrical transport in LSMO with enhanced temperature of metal-insulator transition, J. Electr. Engn. 65 (2012) 270.

Cambel, V. and Karapetrov, G.: Micromagnetic simulations of pac-man-like nanomagnets for memory applications, J. Nanosci Nanotechnol. 12 (2012) 7422-7425.

Pardo, E. and Grilli, F.: Numerical simulations of the angular dependence of magnetication AC losses: coated conductors, Roebel cables and double pancake coils, Supercond. Sci Technol. 25 (2012) 014008.

Zápražný, Z., Korytár, D., Áč, V., Konopka, P., and Bielecki, J.: Phase contrast imaging of lightweight objects using microfocus X-ray source and high resolution CCD camera, J. Instrum. 7 (2012) C03005.

2011

Cambel, V. and Karapetrov, G.: Control of vortex chirality and polarity in magnetic nanodots with broken rotational symmetry, Phys. Rev. B 84 (2011) 014424.

Cambel, V., Gregušová, D., Eliáš, P., Fedor, J., Kostič, I., Maňka, J., and Ballo, P.: Switching magnetization magnetic force microscopy – an alternative to conventional lift-mode MFM, J. Electr. Engn. 62 (2011) 37-43.

Fröhlich, K., Fedor, J., Kostič, I., Maňka, J., and Ballo, P.: Gadolinium scandate: next candidate for alternative gate dielelectric in CMOS technology?, J. Electr. Engn. 62 (2011) 54-56.

Fröhlich, K., Hudec, B., Aarik, J., Tarre, A., Machajdík, D., Kasikov, A., Hušeková, K., and Gaži, Š.: Post-deposition processing and oxygen content of TiO2-based capacitors, Microelectr. Engn. 88 (2011) 1525-1528.

Hudec, B., Hušeková, K., Tarre, A., Han, J.H., Han, S., Rosová, A., Lee, W., Kasikov, A., Song, S.J., Aarik, J., Hwang, C.S., and Fröhlich, K.: Electrical properties of TiO2-based MIM capacitors deposited by TiCl4 and TTIP based atomic layer deposition processes, Microelectr. Engn. 88 (2011) 1514-1516.

Hasenöhrl, S., Novák, J., Vávra, I., Šoltýs, J., Kučera, M., and Šatka, A.: Epitaxial growth of GaP/InxGa1-xP (xIn≥0.27) virtual substrate for optoelectronic applications, J. Electr. Engn. 62 (2011).

Maňka, J., Cigáň, A., Polovková, J., Koňakovský, A., and Prnová, A.: Effects of slight non-stoichiometry in Sm-Ba-Cu-O systems on magnetic charcteristics, Measurement Sci Rev. 11 (2011) 1-6.

Štrbik, V., Beňačka, Š., Gaži, Š., Šmatko, V., Chromik, Š., Dujavová, A., and Vávra, I.: Effect of gallium focused ion beam irradiation on properties of YBa2Cu3Ox/La0,67Sr0,33MnO3 heterostructures, J. Electr. Engn. 62 (2011) 109-113.

2010

Jurkovič, M., Hušeková, K., Čičo, K., Dobročka, E., Nemec, M., Fedor, J., and Fröhlich, K.: Characterization of high permittivity GdScO3 films prepared by liquid injection MOCVD. In: ASDAM '10. Smolenice 2010. Ed. J. Breza et al. Piscataway: IEEE 2010. ISBN: 978-1-4244-8572-7. P. 247-250.

Kostič, I., Benčúrová, A., Barák, V., Ritomský, A., Konečníková, A., Nemec, P., Andok, R., Matay, L., Hrkút, P., and Čaplovič, I.: Investigation of exposure parameters of e-beam resists for photomasks fabrication. In: PRONANO: proc. Integrated Project on Massively Parallel Intelligent Cantilever Probe Platforms for Nanoscale Analysis and Synthesis. Eds. Th. Sulzbach, I.W. Rangelow. - Münster : MV Wissenschaft, 2010, p. 99-110. ISBN 978-3-86991-177-9.

Matay, L., Andok, R., Barák, V., Ritomský, A., Konečníková, A., Kostič, I., Partel, S., and Hudek, P.: Material optimization of the alignment marks for the EBDW lithography. In: ASDAM '10. Smolenice 2010. Ed. J. Breza et al. Piscataway: IEEE 2010. ISBN: 978-1-4244-8572-7. P. 85-88.

Rosová, A., Kováč, P., Hušek, I., Melišek, T., Kopera, L., Šmatko, V. a Vávra, I.: Difúzia materiálu v supravodivých kábloch analyzovaná pomocou zariadenia Quanta 3D, Technika 8 (2010) 48-49.

Šiffalovič, P., Chitu, L., Majková, E., Végso, K., Jergel, M., Luby, Š., Capek, I., Satka, A., Maier, G.A., Keckes, J., Timmann, A., and Roth, S.V.: Kinetics of nanoparticle reassembly mediated by UV-photolysis of surfactant, Langmuir 26 (2010) 5451-5455.

Šiffalovič, P., Jergel, M., Chitu, L., Majková, E., Maťko, I., Luby, Š., Timmann, A., Volker Roth, S., Keckes, J., Maier, G.A., Hembd, A., Hertlein, F., and Wiesmann, J.: Interface study of a high-performance W/B4C X-ray mirror, J. Applied Crystall. 43 (2010) 1431-1439.

Šiffalovič, P., Chitu, L., Végso, K., Majková, E., Jergel, M., Weis, M. Jr., Luby, Š., Capek, I., Keckes, J., Maier, G.A., Satka, A., Perlich, J., and Roth, S.V.: Towards strain gauges based on a self-assembled nanoparticle monolayer- SAXS study, Nanotechnol. 21 (2010) 385702.

Šiffalovič, P., Végso, K., Jergel, M., Majková, E., Keckes, J., Maier, G.A., Cornejo, M., Ziberi, B., Frost, F., Hasse, B., and Wiesmann, J.: Measurement of nanopatterned surfaces by real and reciprocal space techniques, Measurement Sci Rev. 10 (2010), no. 5, p. 153-156.

Vegso, K., Šiffalovič, P., Jergel, M., Majková, E., Keckes, J., Maier, G.A., Cornejo, M., Ziberi, B., and Frost, F.: Development of the table-top GISAXS system for surface/interface analysis. In: 7th Solid State Surfaces Surfaces and Interfaces. Extended Abstract Book. - Bratislava: Comenius Univ., 2010, p. 64-65. ISBN 978-80-223-2938-5.

Jergel, M., Végso, K., Šiffalovič, P., Weis, M. Jr., Halahovets, Y., Majková, E., Luby, Š., Capek, I.: X-ray scattering methods and new X-ray laboratory for coplanar and non-coplanar reciprocal space mapping of sold and liquid surfaces at the Institute of Physics SAS, Materials Structure 17 (2010) k17-k21.

Šoltýs, J. a Ballo, P.: Zaostrovanie hrotov skenovacích mikroskopov pomocou fokusovaného iónového zväzku, Technika 8 (2010) 34.

Novák, J., Šoltýs, J., Eliáš, P., Hasenöhrl, S., and Vávra, I.: Study of the growth and structural properties of InMnAs dots grown on high-index surfaces by MOVPE, Mater. Sci Semicond. Proc. 13 (2010) 167-172.

Stoklas, R., Gregušová, D., Gaži, Š., Novák, J., and Kordoš, P.: AlGaN/GaN MIS-HFETs with Al-based dielectric layers prepared by sputtering technique. In: HETECH 2010. 19th European Workshop on Heterostructure Technol. Book of Abstracts. Fodele, Crete, Greece 2010.

Šmatko, V., Kováčová, E., Križanová, Z., and Vávra, I.: Ion beam patterning of microelectronic components. In: Mikroskopie 2010. Nové Mesto na Morave 2010.


Aktualizácia: január 2012